Measurement of transparency of thin beryllium x-ray windows by means of fluorescense lines produced by a Cm244 alpha source

Claudio Gizzi; Giorgio Patria; Tor Andersson; Maria Nerina Cinti; Enrico Costa; Philip E. Kaaret; Paolo Soffitta; John A. Tomsick

doi:10.1117/12.283800

15 October 1997 Measurement of transparency of thin beryllium x-ray windows by means of fluorescense lines produced by a Cm₂₄₄ alpha source

Claudio Gizzi, Giorgio Patria, Tor Andersson, Maria Nerina Cinti, Enrico Costa, Philip E. Kaaret, Paolo Soffitta, John A. Tomsick

Author Affiliations +

Proceedings Volume 3114, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII; (1997) https://doi.org/10.1117/12.283800
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

We present the results of the measurement of transparency of five round beryllium windows for the LEIPC (low energy imaging proportional counter) of the stellar x-ray polarimeter (SXRP) experiment which will be flown on board the spectrum x-gamma Russian satellite. Each window was tested across its entire surface by using an x-ray fluorescence beam produced by a Cm²⁴⁴ alpha source. We mapped the physical properties of the whole set in order either to verify the performance of the manufacturing method and to select the window having the highest counting rate and the most homogeneous transparency. This is crucial in order to both enhance the scientific capability of the experiment and to reduce the impact of possible systematic effects due to pointing instability which could occur during the observation of celestial sources.

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Claudio Gizzi, Giorgio Patria, Tor Andersson, Maria Nerina Cinti, Enrico Costa, Philip E. Kaaret, Paolo Soffitta, and John A. Tomsick "Measurement of transparency of thin beryllium x-ray windows by means of fluorescense lines produced by a Cm₂₄₄ alpha source", Proc. SPIE 3114, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII, (15 October 1997); https://doi.org/10.1117/12.283800

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