Measurement of waveplate retardation using a photoelastic modulator

Theodore C. Oakberg

doi:10.1117/12.278971

3 October 1997 Measurement of waveplate retardation using a photoelastic modulator

Theodore C. Oakberg

Proceedings Volume 3121, Polarization: Measurement, Analysis, and Remote Sensing; (1997) https://doi.org/10.1117/12.278971
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

A system for measurement of waveplate retardation using a photoelastic modulator will be described. The system is intended for incoming quality inspection of quarter-wave plates at 632.8 nm and 900 nm. Measurement of several polymer waveplates were in good agreement with the waveplate manufacturer's calibration data.

Citation Download Citation

Theodore C. Oakberg "Measurement of waveplate retardation using a photoelastic modulator", Proc. SPIE 3121, Polarization: Measurement, Analysis, and Remote Sensing, (3 October 1997); https://doi.org/10.1117/12.278971

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