Sensitivity of far-field speckle pattern to the small local changes of the rough surface geometry

Michel A. Josse; Zong Qi Lin; Zu-Han Gu

doi:10.1117/12.287802

26 September 1997 Sensitivity of far-field speckle pattern to the small local changes of the rough surface geometry

Michel A. Josse, Zong Qi Lin, Zu-Han Gu

Proceedings Volume 3141, Scattering and Surface Roughness; (1997) https://doi.org/10.1117/12.287802
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

We report the experimental results which show that the far- field correlation function is sensitive to a small local change of the rough surface geometry, where the speckle spatial correlation is adopted rather than the sample ensemble average. The angular cross-correlation function of the far field speckles scattered by one-dimensional random rough surfaces is measured, when a polarized beam of light is incident on the rough surface from vacuum, where one part of the surface used is a thin dielectric film deposited on a glass substrate and the other part is identical to the first one except for a localized defect on it.

Citation Download Citation

Michel A. Josse, Zong Qi Lin, and Zu-Han Gu "Sensitivity of far-field speckle pattern to the small local changes of the rough surface geometry", Proc. SPIE 3141, Scattering and Surface Roughness, (26 September 1997); https://doi.org/10.1117/12.287802

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