Spherical bent focusing analyzer for high-resolution inelastic x-ray scattering

Markus Schwoerer-Boehning; Peter M. Abbamonte; Albert T. Macrander; Vladimir I. Kushnir

doi:10.1117/12.294487

11 December 1997 Spherical bent focusing analyzer for high-resolution inelastic x-ray scattering

Markus Schwoerer-Boehning, Peter M. Abbamonte, Albert T. Macrander, Vladimir I. Kushnir

Proceedings Volume 3151, High Heat Flux and Synchrotron Radiation Beamlines; (1997) https://doi.org/10.1117/12.294487
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

A new technique for making a high resolution X-ray analyzer is presented. The analyzer consists of a silicon wafer with <111> orientation, a Pyrex glass wafer and a concave polished Pyrex glass substrate. The energy resolution of the analyzer was studied on the inelastic scattering beamline of the Synchrotron Radiation Instrumentation Collaborative Access Team on sector 3 of the APS using the Si(777) back reflection at 13.84 keV. Details are presented and compared with other techniques, and we discuss contributions of the measured energy resolution.

Citation Download Citation

Markus Schwoerer-Boehning, Peter M. Abbamonte, Albert T. Macrander, and Vladimir I. Kushnir "Spherical bent focusing analyzer for high-resolution inelastic x-ray scattering", Proc. SPIE 3151, High Heat Flux and Synchrotron Radiation Beamlines, (11 December 1997); https://doi.org/10.1117/12.294487

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