Paper
1 November 1997 Supermirror fabrication via electroforming
Melville P. Ulmer, Robert I. Altkorn, Allen S. Krieger, Daniel R. Parsignault, Yip-Wah Chung, M. S. Wong, Barry P. Lai, Derrick C. Mancini, Peter Z. Takacs, Eugene L. Church
Author Affiliations +
Abstract
As part of a project to develop methods of placing highly reflective multilayer coatings on the inside of Wolter I mirrors, we have been pursuing a program of measuring flat mirrors. These flats have been produced and examined at various stages of the process we plan to use to fabricate multilayer coated Wolter I mirrors. The flats were measured via optical profiler, AFM, (both done at Brookhaven National Lab) and X-ray reflection (done at the Argonne National Lab Advanced Photon Source). We report for the first time, to our knowledge, the successful placement of multilayers on an electroform by depositing the multilayers on a master and then electroforming onto this master and removing the multilayers, intact, on the electroform. This process is the one we plan to use to place multilayers on the inside of Wolter I optics.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Melville P. Ulmer, Robert I. Altkorn, Allen S. Krieger, Daniel R. Parsignault, Yip-Wah Chung, M. S. Wong, Barry P. Lai, Derrick C. Mancini, Peter Z. Takacs, and Eugene L. Church "Supermirror fabrication via electroforming", Proc. SPIE 3152, Materials, Manufacturing, and Measurement for Synchrotron Radiation Mirrors, (1 November 1997); https://doi.org/10.1117/12.295562
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Multilayers

X-rays

Mirrors

Atomic force microscopy

Gold

Nickel

Reflectivity

RELATED CONTENT


Back to Top