XOP: a multiplatform graphical user interface for synchrotron radiation spectral and optics calculations

Manuel Sanchez del Rio; Roger J. Dejus

doi:10.1117/12.295554

1 November 1997 XOP: a multiplatform graphical user interface for synchrotron radiation spectral and optics calculations

Manuel Sanchez del Rio, Roger J. Dejus

Author Affiliations +

Proceedings Volume 3152, Materials, Manufacturing, and Measurement for Synchrotron Radiation Mirrors; (1997) https://doi.org/10.1117/12.295554
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

XOP (X-ray OPtics utilities) is a graphical user interface (GUI) created to execute several computer programs that calculate the basic information needed by a synchrotron beamline scientist (designer or experimentalist). Typical examples of such calculations are: insertion device (undulator or wiggler) spectral and angular distributions, mirror and multilayer reflectivities, and crystal diffraction profiles. All programs are provided to the user under a unified GUI, which greatly simplifies their execution. The XOP optics applications (especially mirror calculations) take their basic input (optical constants, compound and mixture tables) from a flexible file-oriented database, which allows the user to select data from a large number of choices and also to customize their own data sets. XOP includes many mathematical and visualization capabilities. It also permits the combination of reflectivities from several mirrors and filters, and their effect, onto a source spectrum. This feature is very useful when calculating thermal load on a series of optical elements. The XOP interface is written in the IDL (Interactive Data Language). An embedded version of XOP, which freely runs under most Unix platforms (HP, Sun, Dec, Linux, etc) and under Windows95 and NT, is available upon request.

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Manuel Sanchez del Rio and Roger J. Dejus "XOP: a multiplatform graphical user interface for synchrotron radiation spectral and optics calculations", Proc. SPIE 3152, Materials, Manufacturing, and Measurement for Synchrotron Radiation Mirrors, (1 November 1997); https://doi.org/10.1117/12.295554

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