Paper
13 June 1997 Observation of the new lines in photoluminescence from MOCVD-grown GaAs
Mariusz Ciorga, Jan Misiewicz, Marek J. Tlaczala, Marek Panek, Erling Veje
Author Affiliations +
Proceedings Volume 3179, Solid State Crystals in Optoelectronics and Semiconductor Technology; (1997) https://doi.org/10.1117/12.276211
Event: XII Conference on Solid State Crystals: Materials Science and Applications, 1996, Zakopane, Poland
Abstract
The photoluminescence (PL) spectra of MOCVD-grown GaAs samples have been measured at 10K, and for the most representative sample, PL spectra were recorded from 10 to 150K. Besides of the well-established transitions, a hitherto unreported peak was seen at 1.454 eV. The identification of a line at 1.408 eV is discussed.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mariusz Ciorga, Jan Misiewicz, Marek J. Tlaczala, Marek Panek, and Erling Veje "Observation of the new lines in photoluminescence from MOCVD-grown GaAs", Proc. SPIE 3179, Solid State Crystals in Optoelectronics and Semiconductor Technology, (13 June 1997); https://doi.org/10.1117/12.276211
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KEYWORDS
Gallium arsenide

Luminescence

Carbon

Metalorganic chemical vapor deposition

Silicon

Hydrogen

Phonons

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