Three-dimensional measurement of specular free-form surfaces with a structured-lighting reflection technique

Denis Perard; Juergen Beyerer

doi:10.1117/12.294443

10 December 1997 Three-dimensional measurement of specular free-form surfaces with a structured-lighting reflection technique

Denis Perard, Juergen Beyerer

Author Affiliations +

Proceedings Volume 3204, Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III; (1997) https://doi.org/10.1117/12.294443
Event: Intelligent Systems and Advanced Manufacturing, 1997, Pittsburgh, PA, United States

Abstract

A structured-lighting reflection technique was developed in order to detect and measure small wavinesses and curvature defects on specular free-form surfaces. It can reconstruct the 3D relief of specular free-form surfaces and display the curvature at each point. A calibrated camera observes the reflection of a retro-illuminated LCD panel through the free- form surface. The use of a coded lighting technique and the knowledge of the setup geometry allow to locate each observed point on the LCD panel. Using the principle of inverse ray tracing, a surface modelled with Bezier polynomials is fitted to the observed data. Unlike structured-lighting projection techniques which are directly sensitive to the topography of the surface to be inspected, the structured-lighting reflection techniques are essentially sensitive to the gradient and thus enable the detection and measurement of curvature defects which are imperceptible using the projection techniques.

Citation Download Citation

Denis Perard and Juergen Beyerer "Three-dimensional measurement of specular free-form surfaces with a structured-lighting reflection technique", Proc. SPIE 3204, Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (10 December 1997); https://doi.org/10.1117/12.294443

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