Paper
26 June 1998 Accuracy and precision of 3D cephalometric landmarks from biorthogonal plain-film x rays
David Dean, Martin Palomo, Krishna Subramanyan, Mark G. Hans, B. Holly Broadbent Jr., Alexander Moullas, Omar Macaraeg
Author Affiliations +
Abstract
Three dimensional (3D) plain film radiographic cephalometric analysis of boney skull landmarks may be used for patient diagnosis, treatment planning, prosthetic design, intra- operatively, and outcome assessment. To test the accuracy and reliability of 50 cephalometric landmarks, three dry human skulls, with and without metallic markers affixed to the landmarks, were digitized in our 3dCEPH software by 4 operators. The average inter-operator variability about mean landmark position, across all operators, for all 3 skull image pairs, was 3.33 mm. Ten landmarks exhibiting least variability were 1.15 mm average distance from the mean, including: B point 0.69 mm, Lower Incisal Edge 0.85 mm, and Anterior Nasal Spine 0.90 mm. The average rms error from the metallic fiducials for these 4 operators across all 50 landmarks, and 3 skulls was 5.03 mm. The 10 landmarks with the least variability exhibited 2.01 mm average distance from the fiducial, including: B point 1.69 mm, upper incisal edge 1.71 mm, lower incisal edge 1.78 mm. Additional studies are needed to test the robusticity of the hypothesis of homologous anatomy. Homology of landmarks is important to cephalometric comparisons between image pairs representing patient and 'normative,' pre- and post-surgical alteration, and different ages of the same patient.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David Dean, Martin Palomo, Krishna Subramanyan, Mark G. Hans, B. Holly Broadbent Jr., Alexander Moullas, and Omar Macaraeg "Accuracy and precision of 3D cephalometric landmarks from biorthogonal plain-film x rays", Proc. SPIE 3335, Medical Imaging 1998: Image Display, (26 June 1998); https://doi.org/10.1117/12.312532
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Cited by 6 scholarly publications and 8 patents.
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KEYWORDS
Skull

X-rays

3D image processing

Head

Radiography

Reliability

3D metrology

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