New CsI/a-Si 17" x 17" x-ray flat-panel detector provides superior detectivity and immediate direct digital output for general radiography systems

Christophe Chaussat; Jean Chabbal; Thierry Ducourant; Vincent Spinnler; Gerard Vieux; Robert Neyret

doi:10.1117/12.317049

24 July 1998 New CsI/a-Si 17" x 17" x-ray flat-panel detector provides superior detectivity and immediate direct digital output for general radiography systems

Christophe Chaussat, Jean Chabbal, Thierry Ducourant, Vincent Spinnler, Gerard Vieux, Robert Neyret

Author Affiliations +

Proceedings Volume 3336, Medical Imaging 1998: Physics of Medical Imaging; (1998) https://doi.org/10.1117/12.317049
Event: Medical Imaging '98, 1998, San Diego, CA, United States

Abstract

A new 17' X 17' immediate direct digital flat panel detector has been developed to fit the needs of General Radiography. After reviewing a few key aspects of the General Radiography needs (X-ray energy range and associated measurement conditions, system integration and system operation), we describe the new detector Cesium Iodide/Amorphous Silicon based technology, and give measurement results (MTF, DQE stability). We compare the new detector performance to existing technologies (film/screen combination, storage phosphor devices) and also to other flat panel solutions (Selenium). We conclude that the CsI/a-Si technology is now the best suited one in order to fit the needs of General Radiography, this means all kinds of examinations (chest, abdomen, bones, extremities. . .) which have been up to now done using films.

Citation Download Citation

Christophe Chaussat, Jean Chabbal, Thierry Ducourant, Vincent Spinnler, Gerard Vieux, and Robert Neyret "New CsI/a-Si 17" x 17" x-ray flat-panel detector provides superior detectivity and immediate direct digital output for general radiography systems", Proc. SPIE 3336, Medical Imaging 1998: Physics of Medical Imaging, (24 July 1998); https://doi.org/10.1117/12.317049

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