Paper
31 July 1998 Receiver-beam characterization for the SMA
Ming-Tang Chen, C.-Y. E. Tong, Raymond Blundell, D. Cosmo Papa, Scott N. Paine
Author Affiliations +
Abstract
This paper describes the measurement and subsequent data analysis of the signal beam of the receiver system of the Submillimeter Array (SMA). To measure the receiver beam patterns, a 2-axis planar scanning stage is mounted on top of the receiver assembly. Scanning in a plane orthogonal to the optical path, the near-field measuring system maps out both the amplitude and phase at frequencies of 242 and 265 GHz. By analyzing the measured patterns we can inspect the alignment of an individual receiver, and the optical assembly common to all frequency bands. The data also allows us to determine how the receiver couples to the beam waveguide that feeds the SMA antennas. The measured beam patterns of two different receivers, covering frequency bands of 176 - 256 and 250 - 350 GHz, are presented, as well as the analysis of these data. We believe that this is the first time such a rigorous full vectorial radio alignment technique has been applied to millimeter or submillimeter receiving systems for radio astronomy.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ming-Tang Chen, C.-Y. E. Tong, Raymond Blundell, D. Cosmo Papa, and Scott N. Paine "Receiver-beam characterization for the SMA", Proc. SPIE 3357, Advanced Technology MMW, Radio, and Terahertz Telescopes, (31 July 1998); https://doi.org/10.1117/12.317343
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CITATIONS
Cited by 9 scholarly publications.
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KEYWORDS
Receivers

Shape memory alloys

Optical testing

Near field optics

Near field

Optical alignment

Inspection

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