Dichroic beam combiner to support hardware-in-the-loop testing of dual-mode common aperture seekers

Scott B. Mobley; John S. Cole Jr.

doi:10.1117/12.316394

13 July 1998 Dichroic beam combiner to support hardware-in-the-loop testing of dual-mode common aperture seekers

Scott B. Mobley, John S. Cole Jr.

Proceedings Volume 3368, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III; (1998) https://doi.org/10.1117/12.316394
Event: Aerospace/Defense Sensing and Controls, 1998, Orlando, FL, United States

Abstract

The advent of missile seekers with dual-mode millimeter wave and infrared common-aperture sensors has led to a requirement to develop simulation tools necessary to test these systems. Traditionally, one of the most important techniques for supporting systems development has been a full seeker hardware-in-the-loop simulation. For the past three years, U.S. Army Aviation and Missile Command (AMCOM) has been developing the simulation technologies to test these types of system in a hardware-in-the-loop environment. The dichroic beam combiner is the key component of such a facility. This paper focuses on the various dichroic beam combiner technologies that have been considered and are currently under development at AMCOM. This paper will present both experimental and analytical data to describe the performance of each technology. The basis for this paper is work performed at the AMCOM Advanced Simulation Center (ASC). The ASC is managed and operated by the Systems Simulation and Development Directorate of the Missile Research, Development, and Engineering Center, Redstone Arsenal, Alabama.

Citation Download Citation

Scott B. Mobley and John S. Cole Jr. "Dichroic beam combiner to support hardware-in-the-loop testing of dual-mode common aperture seekers", Proc. SPIE 3368, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III, (13 July 1998); https://doi.org/10.1117/12.316394

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