Requirements and methodologies for real-time infrared sensor emulation in hardware-in-the-loop testing

James A. Buford Jr.; Terry M. Reynolds

doi:10.1117/12.316381

13 July 1998 Requirements and methodologies for real-time infrared sensor emulation in hardware-in-the-loop testing

Proceedings Volume 3368, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III; (1998) https://doi.org/10.1117/12.316381
Event: Aerospace/Defense Sensing and Controls, 1998, Orlando, FL, United States

Abstract

Hardware-in-the-loop (HWIL) testing of infrared missile seekers has been a proven method for seeker evaluation for many years. Infrared HWIL testing has two primary modes, projection or injection. With infrared projection HWIL testing, the seeker's optics and detectors are retained as part of the simulation since an infrared scene in the correct waveband is presented to the seeker's optics, and is then detected and processed. When using the injection mode of HWIL testing the infrared scene is injected directly into the seeker's electronics and bypasses the imaging and detection process. When this type of simulation is used it is critical to model the optical and electrical processes that would have degraded the image in a real-world scenario. Real-time modeling of sensor system modulation transfer functions and other forms of image degradation is a computationally intensive task. The types of calculations necessary for real- time sensor modeling often push the processing requirements past the capabilities of standard processors and custom processing hardware is required. This paper discusses solutions to this problem that have been implemented for infrared seekers at the U.S. Army's Aviation and Missile Command's, Missile Research, Development, and Engineering Center.

Citation Download Citation

James A. Buford Jr. and Terry M. Reynolds "Requirements and methodologies for real-time infrared sensor emulation in hardware-in-the-loop testing", Proc. SPIE 3368, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III, (13 July 1998); https://doi.org/10.1117/12.316381

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