MTF measurement technique for GOES imager

Jay Alan Overbeck; James J. Shea

doi:10.1117/12.319370

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26 August 1998 MTF measurement technique for GOES imager

Jay Alan Overbeck, James J. Shea

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Proceedings Volume 3377, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing IX; (1998) https://doi.org/10.1117/12.319370
Event: Aerospace/Defense Sensing and Controls, 1998, Orlando, FL, United States

Abstract

One of the sub-tasks for the GOES N/O program is to redesign the assembly/test program to reduce instrument test time and to make test results more comparable to data that can be taken on orbit and at the spacecraft integrator's facility. Currently, ITT A/CD measures the instrument MTF at specific spatial frequencies using a collimator and bar targets. This gives only a few individual points on the MTF curve. To improve this production test, the MTF will now be measured by scanning a single slit target. The result of this slit scan is the Line Spread Function (LSF) and the Fourier Transform of the LSF yields the continuous frequency MTF curve. Obtaining this curve with a single target eliminates the need for repeated scans using different spatial frequency targets. A problem with scanning a slit for this application is the number of samples taken across it is very few when the GOES scanner is running at operational speed. Two methods to collect multiple scan lines and recombining the scans to get a `highly sampled' scan of the slit have been considered. This paper discusses the two approaches and presents a validation of the slit scan method for both a slow scan of the target and for an operational speed scan where multiple scan lines are recombined to give a highly sampled slit.

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Jay Alan Overbeck and James J. Shea "MTF measurement technique for GOES imager", Proc. SPIE 3377, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing IX, (26 August 1998); https://doi.org/10.1117/12.319370

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