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26 August 1998 Most-suitable nonuniformity correction method for PtSi SBD detector
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Abstract
Currently, there are several kinds of infrared imaging system with 2D detector using PtSi, InSb, MCT and any others in the commercial market. The infrared imaging system with 2D detector is generally required to correct non-uniformity of response of each pixel in order to display satisfactory infrared images. This non-uniformity correction is normally performed digitally after an ADC. Furthermore, this operation should be finished within a field time, therefore it must work correspondingly fast. PtSi detector has non- linear Input/Output characteristics because of their spectral response characteristics. Therefore, two point gain/offset correction is not suitable for non-linear characteristics detector. This paper reports on three alternate methods for non-uniformity correction for PtSi detector. These methods are actually tested and then the uniformity performances after these corrections are measured. The standard deviation of the residual fixed pattern noise is used to evaluate the performance of non- uniformity correction.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yasujiro Kiyota "Most-suitable nonuniformity correction method for PtSi SBD detector", Proc. SPIE 3377, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing IX, (26 August 1998); https://doi.org/10.1117/12.319365
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