Detection of bands in backscatter microscopy images using new Hough transform techniques

David P. Casasent; Linsen Chen; Ashit Talukder

doi:10.1117/12.316530

8 July 1998 Detection of bands in backscatter microscopy images using new Hough transform techniques

David P. Casasent, Linsen Chen, Ashit Talukder

Proceedings Volume 3389, Hybrid Image and Signal Processing VI; (1998) https://doi.org/10.1117/12.316530
Event: Aerospace/Defense Sensing and Controls, 1998, Orlando, FL, United States

Abstract

Electron backscatter patterns are used to analyze the crystallographic structure of materials and extract 3D grain orientation data that is of use in material science. We present new Hough transform pre- and post-processing algorithms to improve analysis of such data. Our new technique also reduces the computation time required.

Citation Download Citation

David P. Casasent, Linsen Chen, and Ashit Talukder "Detection of bands in backscatter microscopy images using new Hough transform techniques", Proc. SPIE 3389, Hybrid Image and Signal Processing VI, (8 July 1998); https://doi.org/10.1117/12.316530

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