PROCEEDINGS VOLUME 3399
NON-DESTRUCTIVE EVALUATION TECHNIQUES FOR AGING INFRASTRUCTURE AND MANUFACTURING | 31 MARCH - 2 APRIL 1998
Process Control and Sensors for Manufacturing
Editor(s): Richard H. Bossi, David M. Pepper
Editor Affiliations +
IN THIS VOLUME

7 Sessions, 28 Papers, 0 Presentations
Sensors I  (4)
Sensors II  (5)
Sensors III  (4)
NON-DESTRUCTIVE EVALUATION TECHNIQUES FOR AGING INFRASTRUCTURE AND MANUFACTURING
31 March - 2 April 1998
San Antonio, TX, United States
Sensors I
Ron T. Lake
Proceedings Volume Process Control and Sensors for Manufacturing, (1998) https://doi.org/10.1117/12.302536
Eugene Nekhendzy, Steve Wnuk
Proceedings Volume Process Control and Sensors for Manufacturing, (1998) https://doi.org/10.1117/12.302545
Jonathan A. Greene, Carrie L. Kozikowski, Rob O'Neal, Stephen H. Poland, Michael P. Camden, Larry W. Simmons
Proceedings Volume Process Control and Sensors for Manufacturing, (1998) https://doi.org/10.1117/12.302555
Marvin B. Klein, Gerald David Bacher
Proceedings Volume Process Control and Sensors for Manufacturing, (1998) https://doi.org/10.1117/12.302559
Sensors II
Proceedings Volume Process Control and Sensors for Manufacturing, (1998) https://doi.org/10.1117/12.302560
Jonathan A. Greene, Mark E. Jones, Timothy A. Bailey, Ignacio M. Perez
Proceedings Volume Process Control and Sensors for Manufacturing, (1998) https://doi.org/10.1117/12.302561
Gary L. Workman, G. Wayne Thompson, Billy H. Nerren, H. Dewitt Burns Jr.
Proceedings Volume Process Control and Sensors for Manufacturing, (1998) https://doi.org/10.1117/12.302562
Joerg Peters, Armin Schoene
Proceedings Volume Process Control and Sensors for Manufacturing, (1998) https://doi.org/10.1117/12.302563
HaSul Kim, Changhyun Park, Young Tae Shin, Jin Yang Jung
Proceedings Volume Process Control and Sensors for Manufacturing, (1998) https://doi.org/10.1117/12.302537
Sensors III
W. Huang, Steve M. Ziola, John F. Dorighi, Michael R. Gorman
Proceedings Volume Process Control and Sensors for Manufacturing, (1998) https://doi.org/10.1117/12.302538
Susan C. Mantell, D. Holley, Elizabeth J. Linstrom
Proceedings Volume Process Control and Sensors for Manufacturing, (1998) https://doi.org/10.1117/12.302539
Michel B. Lemistre, Remi Gouyon, Daniel L. Balageas
Proceedings Volume Process Control and Sensors for Manufacturing, (1998) https://doi.org/10.1117/12.302540
Thomas Chatters Hale, Thomas J. Asaki, Kenneth L. Telschow, Jim Hoffer
Proceedings Volume Process Control and Sensors for Manufacturing, (1998) https://doi.org/10.1117/12.302541
Process Monitoring I
Eric Udd, Kelli Corona-Bittick, Jim Dorr, Kerry T. Slattery
Proceedings Volume Process Control and Sensors for Manufacturing, (1998) https://doi.org/10.1117/12.302542
Kerry T. Slattery, Kelli Corona-Bittick, Donald James Dorr
Proceedings Volume Process Control and Sensors for Manufacturing, (1998) https://doi.org/10.1117/12.302543
Szu-Sheng L. Wen, Tzu-Fang Chen, Demartonne Ramos-Franca, Ky T. Nguyen, Cheng-Kuei Jen, Ikuo Ihara, A. Derdouri, Andres Garcia-Rejon
Proceedings Volume Process Control and Sensors for Manufacturing, (1998) https://doi.org/10.1117/12.302544
Process Monitoring II
Todd Peterson, Richard H. Bossi
Proceedings Volume Process Control and Sensors for Manufacturing, (1998) https://doi.org/10.1117/12.302546
Wayne M. Latham, P. Jerry Latimer, Daniel T. MacLauchlan, Kenneth R. Camplin, Dennis D. Lang
Proceedings Volume Process Control and Sensors for Manufacturing, (1998) https://doi.org/10.1117/12.302547
Jorge J. Alcoz, Charles E. Duffer
Proceedings Volume Process Control and Sensors for Manufacturing, (1998) https://doi.org/10.1117/12.302548
Shaun W. Lawson, Gary R. Bonser
Proceedings Volume Process Control and Sensors for Manufacturing, (1998) https://doi.org/10.1117/12.302549
Proceedings Volume Process Control and Sensors for Manufacturing, (1998) https://doi.org/10.1117/12.302550
Penetrating Radiation
Einar E. Anderson, Mark A. Hartney, Richard L. Weisfield
Proceedings Volume Process Control and Sensors for Manufacturing, (1998) https://doi.org/10.1117/12.302551
George Vourvopoulos, Phillip C. Womble, Michael D. Belbot, Jonathon Paschal, Gary M. Spichiger
Proceedings Volume Process Control and Sensors for Manufacturing, (1998) https://doi.org/10.1117/12.302552
Michael E. Brauss, James A. Pineault, John S. Eckersley
Proceedings Volume Process Control and Sensors for Manufacturing, (1998) https://doi.org/10.1117/12.302553
Robert N. Yancey
Proceedings Volume Process Control and Sensors for Manufacturing, (1998) https://doi.org/10.1117/12.302554
David L. Gilblom, Richard E. Colbeth, Mark Batts, Bruce Meyer
Proceedings Volume Process Control and Sensors for Manufacturing, (1998) https://doi.org/10.1117/12.302556
Posters--Wednesday
Shoucheng Yang, Xiaoyang Yu, Hua Guo, Yan Wang
Proceedings Volume Process Control and Sensors for Manufacturing, (1998) https://doi.org/10.1117/12.302557
Gary R. Bonser, Shaun W. Lawson
Proceedings Volume Process Control and Sensors for Manufacturing, (1998) https://doi.org/10.1117/12.302558
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