Surface defect induced by strong electric field probed by soft x-ray laser interferometry

F. Albert; Philippe Zeitoun; Denis Joyeux; Mustapha Boussoukaya; Antoine Carillon; S. Hubert; Pierre Jaegle; Gerard Jamelot; Annie Klisnick; Daniel Phalippou; David Ros; Stephane Sebban; Anne Zeitoun-Fakiris

doi:10.1117/12.308642

26 May 1998 Surface defect induced by strong electric field probed by soft x-ray laser interferometry

F. Albert, Philippe Zeitoun, Denis Joyeux, Mustapha Boussoukaya, Antoine Carillon, S. Hubert, Pierre Jaegle, Gerard Jamelot, Annie Klisnick, Daniel Phalippou, David Ros, Stephane Sebban, Anne Zeitoun-Fakiris

Author Affiliations +

Proceedings Volume 3404, ALT'97 International Conference on Laser Surface Processing; (1998) https://doi.org/10.1117/12.308642
Event: ALT '97 International Conference on Laser Surface Processing, 1997, Limoges, France

Abstract

We use x-ray laser interferometry to probe defects induced by a strong electric field on niobium surface. Niobium has been chosen on account of its frequent use in superconductive cavities of particle accelerators. The x-ray laser emits bright, 50 ps-duration pulses at (lambda) equals 21.2 nm. The beam is reflected on the niobium surface under grazing incidence. The interferometer is of the wave-front division type. Interferograms are single shot recorded, which enables to probe `instantaneous' defect morphology. We observed appearance and evolution of defects between 14 MV/m and 35 MV/m. The vertical set amplitude is of 10 - 20 nm. The defect structure has been observed to shift by 500 micrometers along the metal surface under a constant 35 MV/m electric field, during the 20 minutes time interval between two laser shots.

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F. Albert, Philippe Zeitoun, Denis Joyeux, Mustapha Boussoukaya, Antoine Carillon, S. Hubert, Pierre Jaegle, Gerard Jamelot, Annie Klisnick, Daniel Phalippou, David Ros, Stephane Sebban, and Anne Zeitoun-Fakiris "Surface defect induced by strong electric field probed by soft x-ray laser interferometry", Proc. SPIE 3404, ALT'97 International Conference on Laser Surface Processing, (26 May 1998); https://doi.org/10.1117/12.308642

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