State of the Art in Optical Metrology I
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323297
Walter Schumann
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323308
Reinhold Ritter
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323319
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323330
Michel Spajer
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323341
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323352
Progress in Phase Measurement Interferometry
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323363
Yves Surrel
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323372
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323373
Jonathan Mark Huntley, C. R. Coggrave
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323298
State of the Art in Optical Metrology II
Hans J. Tiziani, Bernhard Franze, Pascal Haible, Charles Joenathan
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323299
Fu-Pen Chiang, M. L. Du, I. M. Kao
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323300
Terry Y. Chen
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323301
Raimo Veil Johannes Silvennoinen, Kai-Erik Peiponen
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323302
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323303
Peter Ettl, Berthold E. Schmidt, M. Schenk, Ildiko Laszlo, Gerd Haeusler
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323304
Ichirou Yamaguchi, Akihiro Yamamoto, Masaru Yano
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323305
Holographic Interferometry
Nils-Erik Molin
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323306
Sheng-Mao Tieng
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323307
Thomas M. Kreis, Werner P. O. Jueptner, Juergen Geldmacher
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323309
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323310
Galina V. Dreiden, A. V. Porubov, Alexander M. Samsonov, Irina V. Semenova
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323311
Sergey A. Novikov, Vladimir S. Pisarev, Alexander S. Dzuba, Vladimir D. Grigoriev
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323312
Colloquium in Recognition of Zoltan Fuzessy: International Tribute I
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323313
Paul Smigielski
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323314
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323315
Colloquium in Recognition of Z. Fuzessy: International Tribute II
Pierre Michel Boone
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323316
Hans Rottenkolber
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323317
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323318
Colloquium in Recognition of Z. Fuzessy: Hungarian Tribute I
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323320
A. Hoffmann, Norbert Kroo, Z. Lenkefi, Zsolt Szentirmay
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323321
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323322
Janos Kornis, Attila Nemeth, Nasser Moustafa
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323323
Peter Varga, Peter Torok
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323324
Colloquium in Recognition of Z. Fuzessy: Hungarian Tribute II
Ferenc Gyimesi, Zoltan Fuzessy, Bela Raczkevi, Arpad Pikethy, Szabolcs Balogh, Jozsef Gallai
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323325
Zsolt Benko, E. Farkas, Zsolt Bor, Istvan Ketskemety
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323326
Zsuzsanna Marton, Bela Hopp, Zsolt Toth, Maria Csete, Ferenc Ignacz, Zsolt Bor
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323327
Janos Kornis, Nandor Bokor, Attila Nemeth
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323328
State of the Art in Optical Metrology I
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323329
Speckle Metrology I
Huai Min Shang, Y. M. He, Cho Jui Tay
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323331
Fu-Pen Chiang, Qing Wang
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323332
Erwin K. Hack, Rolf Broennimann
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323333
Rajpal S. Sirohi, Fook Siong Chau, Siew-Lok Toh, Elgin T. Quek
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323334
Jochen Kranz, Juergen Lamprecht, Andrea Hettwer, Johannes Schwider
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323335
Rajpal S. Sirohi, Cho Jui Tay, Huai Min Shang, W. P. Boo
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323336
Optical Methods for the Testing of Microsystem Elements
Volker Grosser, C. Bombach, Wolf Faust, Dietmar Vogel, Bernd Michel
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323337
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323338
Guenther K.G. Wernicke, Oliver Kruschke, Nazif Demoli, Hartmut Gruber
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323339
Fiber Optic Sensors and Applications
Kazuo Hotate, Takashi Saida, Zuyuan He
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323340
Luc Thevenaz, Marc Nikles, Alexandre Fellay, Massimo Facchini, Philippe A. Robert
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323342
Daniele Inaudi, Nicoletta Casanova, Pascal Kronenberg, Samuel Vurpillot
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323343
Rolf Broennimann, Philipp M. Nellen, Peter Anderegg, Urs J. Sennhauser
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323344
Andrea Pedretti, Ezio Cadoni, Daniele Inaudi
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323345
Speckle Metrology II
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323346
Chi-Jen Chen, Pramod Kumar Rastogi
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323347
Ezio Cadoni, Brian W. Bowe, Daniel Albrecht
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323348
Specialized Techniques and Applications I
Peter Torok, L. Mule Stagno
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323349
J. Kostas, J. Cater, J. Soria
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323350
Daniel Holstein, Petra Aswendt, Roland Hoefling, Claus-Dieter Schmidt, Werner P. O. Jueptner
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323351
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323353
Roland Schreiner, Sven Brinkmann, Thomas Dresel, Johannes Schwider
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323354
Denis Lebrun, Samir Belaid, Cafer Ozkul
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323355
Fengzhou Fang, Bryan Kok Ann Ngoi
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323356
Valentina V. Azarova, U. N. Lokhov, K. Malitsky
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323357
Grating and Moire-Related Techniques
Specialized Techniques and Applications II
Nazif Demoli, Guenther K.G. Wernicke, Alexander Hirsch, Sven Krueger, Hartmut Gruber, Mathias Senoner
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323365
Andrew E. Gorodetsky, Mikhail E. Kompan
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323366
Malgorzata Kujawinska, Michal Pawlowski
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323367
A. N. Alexandrin, Irina L. Tarasova
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323368
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323369
J. Cater, J. Kostas, A. Fouras, J. Soria
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323370
Valentina V. Azarova, N. A. Efremova, Vaytcheslav N. Svirin, V. A. Sharov
Proceedings Volume International Conference on Applied Optical Metrology, (1998) https://doi.org/10.1117/12.323371
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