Characterization of the optical nonlinearities of ZnSe using Z-scan techniques

Martin Boulanger; Alain Villeneuve; Michel Piche

doi:10.1117/12.326646

9 October 1998 Characterization of the optical nonlinearities of ZnSe using Z-scan techniques

Martin Boulanger, Alain Villeneuve, Michel Piche

Proceedings Volume 3418, Advances in Optical Beam Characterization and Measurements; (1998) https://doi.org/10.1117/12.326646
Event: Lasers and Materials in Industry and Opto-Contact Workshop, 1998, Quebec, Canada

Abstract

We report on the measurements of the nonlinear susceptibility of ZnSe at 783 nm with 110 fs pulses of various intensities. We point out limitations for the measurement of (chi) ⁽⁵) nonlinear susceptibility using Z- scan technique. We also present a new technique using self- imaging (SIZ-scan) which could provide more sensitive measurements of nonlinear refractive effects.

Citation Download Citation

Martin Boulanger, Alain Villeneuve, and Michel Piche "Characterization of the optical nonlinearities of ZnSe using Z-scan techniques", Proc. SPIE 3418, Advances in Optical Beam Characterization and Measurements, (9 October 1998); https://doi.org/10.1117/12.326646

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