Characterization of far-infrared optical thin film materials and blends: AgBr, AgCl, KBr, Csl, and CsBr

Thomas D. Rahmlow Jr.; Jeanne E. Lazo-Wasem; David A. Rahmlow

doi:10.1117/12.326681

8 October 1998 Characterization of far-infrared optical thin film materials and blends: AgBr, AgCl, KBr, Csl, and CsBr

Thomas D. Rahmlow Jr., Jeanne E. Lazo-Wasem, David A. Rahmlow

Proceedings Volume 3425, Optical Diagnostic Methods for Inorganic Transmissive Materials; (1998) https://doi.org/10.1117/12.326681
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

The selection of thin film materials for use in far infrared filters is limited. While silicon can be used as a high index material in the far infrared, the suitability of low index materials is less understood. In this study, thin film materials with spectral transmission extending from 1 to beyond 30 micrometer are characterized and evaluated for use in Rugate and discrete interference filters. A materials selection matrix was developed, and five materials were selected for characterization. Transmission, reflection and absorption data are presented for AgBr, AgCl, KBr, CsI and CsBr as single material films, and as blends. These materials are characterized for stress, exposure to humidity, and color center formation when exposed to visible light.

Citation Download Citation

Thomas D. Rahmlow Jr., Jeanne E. Lazo-Wasem, and David A. Rahmlow "Characterization of far-infrared optical thin film materials and blends: AgBr, AgCl, KBr, Csl, and CsBr", Proc. SPIE 3425, Optical Diagnostic Methods for Inorganic Transmissive Materials, (8 October 1998); https://doi.org/10.1117/12.326681

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