Characterization of narrowband infrared interference filters

Simon G. Kaplan; Leonard M. Hanssen

doi:10.1117/12.326678

8 October 1998 Characterization of narrowband infrared interference filters

Simon G. Kaplan, Leonard M. Hanssen

Proceedings Volume 3425, Optical Diagnostic Methods for Inorganic Transmissive Materials; (1998) https://doi.org/10.1117/12.326678
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

A Fourier-transform infrared (FT-IR) spectrophotometer system is used to measure the transmittance of infrared band-pass filters as a function of wavelength, temperature, and beam geometry. Measurements are performed using an f/4 beam geometry at normal incidence, or a nearly collimated geometry with variable angle of incidence. Blocking filters are used to expand the dynamic range of the out-of-band measurement to transmittances as low as 10^-6 with 4 cm^-1 resolution.

Citation Download Citation

Simon G. Kaplan and Leonard M. Hanssen "Characterization of narrowband infrared interference filters", Proc. SPIE 3425, Optical Diagnostic Methods for Inorganic Transmissive Materials, (8 October 1998); https://doi.org/10.1117/12.326678

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