Paper
8 October 1998 Problems posed by scattering transmissive materials for accurate transmittance and reflectance measurements
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Abstract
The characterization of the spectral transmittance and reflectance of windows and other optical components is a basic and important measurement. In principal, the measurements are relatively straightforward. However, even with an ideal high- accuracy measurement system, the sample's scattering properties can render the measurement results inaccurate or easily misinterpreted. The effects of low levels of scatter from specular transmissive samples on optical property measurements are demonstrated in the infrared with specular and hemispherical detection instrumentation. Complete measurement of the reflected, transmitted, and scattered light from these samples is demonstrated in the infrared using a center-mount integrating sphere.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Leonard M. Hanssen and Simon G. Kaplan "Problems posed by scattering transmissive materials for accurate transmittance and reflectance measurements", Proc. SPIE 3425, Optical Diagnostic Methods for Inorganic Transmissive Materials, (8 October 1998); https://doi.org/10.1117/12.326677
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Cited by 5 scholarly publications.
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KEYWORDS
Reflectivity

Transmittance

Light scattering

Scattering

Integrating spheres

Optical spheres

Silicon

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