Design and development of a very high resolution thermal imager

Gunther Kuerbitz; Ruediger Duchateau

doi:10.1117/12.328036

26 October 1998 Design and development of a very high resolution thermal imager

Gunther Kuerbitz, Ruediger Duchateau

Proceedings Volume 3436, Infrared Technology and Applications XXIV; (1998) https://doi.org/10.1117/12.328036
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

The design goal of this project was to develop a thermal imaging system with ultimate geometrical resolution without sacrificing thermal sensitivity. It was necessary to fulfil the criteria for a future advanced video standard. This video standard is the so-called HDTV standard (HDTV High Definition TeleVision). The thermal imaging system is a parallel scanning system working in the 7...11 micrometer spectral region. The detector for that system has to have 576 X n (n number of TDI stages) detector elements taking into account a twofold interlace. It must be carefully optimized in terms of range performance and size of optics entrance pupil as well as producibility and yield. This was done in strong interaction with the detector manufacturer. The 16:9 aspect ratio of the HDTV standard together with the high number of 1920 pixels/line impose high demands on the scanner design in terms of scan efficiency and linearity. As an advanced second generation thermal imager the system has an internal thermal reference. The electronics is fully digitized and comprises circuits for Non Uniformity Correction (NUC), scan conversion, electronic zoom, auto gain and level, edge enhancement, up/down and left/right reversion etc. It can be completely remote-controlled via a serial interface.

Citation Download Citation

Gunther Kuerbitz and Ruediger Duchateau "Design and development of a very high resolution thermal imager", Proc. SPIE 3436, Infrared Technology and Applications XXIV, (26 October 1998); https://doi.org/10.1117/12.328036

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
6 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Sensors

Thermography

Scanners

Imaging systems

Electronics

Nonuniformity corrections

Manufacturing

Show All Keywords

Keywords/Phrases

Search In:

Publication Years