Paper
17 December 1998 Precision determination of pion mass using x-ray CCD spectroscopy
D. F. Anagnostopoulos, M. Augsburger, Gunther L. Borchert, D. Chatellard, Michael Mace Daum, J.-P. Egger, Detlev Gotta, P. Hauser, P. Indelicato, E. Jeannet, K. Kirch, Nick Nelms, O. W. Schult, T. Siems, Leopold M. Simons, Alan A. Wells
Author Affiliations +
Abstract
An experiment is described which aims to determine the pion mass to 1 ppm or better, from which a new determination of the upper limit of the muon neutrino mass is anticipated. The approach utilizes spectroscopy of X-ray emissions from pionic atoms formed in gaseous targets. The spectroscopy is performed with a Bragg crystal spectrometer, with an energy resolution of approximately 300 meV, using an array of X-ray CCDs mounted at the focus to measure the spectral line structure of the 4 keV pionic nitrogen transition. To achieve sub-ppm accuracy, as energy calibration a muonic oxygen transition is used. It is known with a precision of 0.3 ppm and almost coincides in energy with the pionic transition.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. F. Anagnostopoulos, M. Augsburger, Gunther L. Borchert, D. Chatellard, Michael Mace Daum, J.-P. Egger, Detlev Gotta, P. Hauser, P. Indelicato, E. Jeannet, K. Kirch, Nick Nelms, O. W. Schult, T. Siems, Leopold M. Simons, and Alan A. Wells "Precision determination of pion mass using x-ray CCD spectroscopy", Proc. SPIE 3443, X-Ray and Ultraviolet Spectroscopy and Polarimetry II, (17 December 1998); https://doi.org/10.1117/12.333618
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KEYWORDS
Spectroscopy

X-rays

Crystals

Charge-coupled devices

Nitrogen

Oxygen

Muons

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