Calibration results for the AXAF flight contamination monitor

Ronald F. Elsner; Stephen L. O'Dell; Brian D. Ramsey; Allyn F. Tennant; Martin C. Weisskopf; Jeffery J. Kolodziejczak; Douglas A. Swartz; Darell E. Engelhaupt; Gordon P. Garmire; John A. Nousek; Mark W. Bautz; Terrance J. Gaetz; Ping Zhao

doi:10.1117/12.331235

19 November 1998 Calibration results for the AXAF flight contamination monitor

Ronald F. Elsner, Stephen L. O'Dell, Brian D. Ramsey, Allyn F. Tennant, Martin C. Weisskopf, Jeffery J. Kolodziejczak, Douglas A. Swartz, Darell E. Engelhaupt, Gordon P. Garmire, John A. Nousek, Mark W. Bautz, Terrance J. Gaetz, Ping Zhao

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Proceedings Volume 3444, X-Ray Optics, Instruments, and Missions; (1998) https://doi.org/10.1117/12.331235
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

The Advanced X-ray Astrophysics Facility (AXAF) ground calibration program, easily the most extensive in the history of high energy astrophysics, requires careful attention to the verification of its validity for on-orbit operations of the observatory. The purpose of the Flight Contamination Monitor (FCM) is to verify the transfer of the AXAF absolute flux scale calibration from ground to on-orbit operations and to measure or bound any changes in molecular contamination on the AXAF mirrors. This paper reports the current status of the analysis of FCM measurements taken during ground calibration. The FCM measurements during the AXAF activation phase will be the first look at the on-orbit AXAF performance.

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Ronald F. Elsner, Stephen L. O'Dell, Brian D. Ramsey, Allyn F. Tennant, Martin C. Weisskopf, Jeffery J. Kolodziejczak, Douglas A. Swartz, Darell E. Engelhaupt, Gordon P. Garmire, John A. Nousek, Mark W. Bautz, Terrance J. Gaetz, and Ping Zhao "Calibration results for the AXAF flight contamination monitor", Proc. SPIE 3444, X-Ray Optics, Instruments, and Missions, (19 November 1998); https://doi.org/10.1117/12.331235

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