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19 November 1998 Characterization of graded d-spacing multilayers for hard x-ray telescopes
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Abstract
The Multilayer Facility at the Center for Astrophysics is involved in developing graded-d spacing multilayers for coating X-ray optics for hard x-ray focusing telescopes. Graded d spacing W/C multilayers have been fabricated on flat substrates of silicon and characterized using specular x-ray reflectivity, AFM, and TEM. Results are presented and compared with theoretical models.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Adrian Ivan, Suzanne E. Romaine, Ricardo J. Bruni, John E. Everett, and Paul Gorenstein "Characterization of graded d-spacing multilayers for hard x-ray telescopes", Proc. SPIE 3444, X-Ray Optics, Instruments, and Missions, (19 November 1998); https://doi.org/10.1117/12.331276
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