Characterization of graded d-spacing multilayers for hard x-ray telescopes

Adrian Ivan; Suzanne E. Romaine; Ricardo J. Bruni; John E. Everett; Paul Gorenstein

doi:10.1117/12.331276

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19 November 1998 Characterization of graded d-spacing multilayers for hard x-ray telescopes

Adrian Ivan, Suzanne E. Romaine, Ricardo J. Bruni, John E. Everett, Paul Gorenstein

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Proceedings Volume 3444, X-Ray Optics, Instruments, and Missions; (1998) https://doi.org/10.1117/12.331276
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

The Multilayer Facility at the Center for Astrophysics is involved in developing graded-d spacing multilayers for coating X-ray optics for hard x-ray focusing telescopes. Graded d spacing W/C multilayers have been fabricated on flat substrates of silicon and characterized using specular x-ray reflectivity, AFM, and TEM. Results are presented and compared with theoretical models.

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Adrian Ivan, Suzanne E. Romaine, Ricardo J. Bruni, John E. Everett, and Paul Gorenstein "Characterization of graded d-spacing multilayers for hard x-ray telescopes", Proc. SPIE 3444, X-Ray Optics, Instruments, and Missions, (19 November 1998); https://doi.org/10.1117/12.331276

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