Error reduction techniques for measuring long synchrotron mirrors

Steven C. Irick

doi:10.1117/12.331122

13 November 1998 Error reduction techniques for measuring long synchrotron mirrors

Steven C. Irick

Proceedings Volume 3447, Advances in Mirror Technology for Synchrotron X-Ray and Laser Applications; (1998) https://doi.org/10.1117/12.331122
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

Error reduction techniques for the long trace profiler are presented. Techniques that have been used for years are critiqued, and new methods are suggested.

Citation Download Citation

Steven C. Irick "Error reduction techniques for measuring long synchrotron mirrors", Proc. SPIE 3447, Advances in Mirror Technology for Synchrotron X-Ray and Laser Applications, (13 November 1998); https://doi.org/10.1117/12.331122

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