Paper
13 November 1998 Fabrication of an aspherical mirror for extreme-ultraviolet lithography (EUVL) optics
Masahito Niibe, Atsushi Miyafuji, Hiroo Kinoshita, Takeo Watanabe, Shozo Inoue, Keiji Koterazawa
Author Affiliations +
Abstract
We report a progress in the aspherization of precision of optical surface by deposition of graded-thickness films onto spherical substrate. As a deposition film, we examined single layer and multilayer film. Mo/Si multilayer had small stress and small surface roughness up to the total film thickness of 1 micrometers , and is suitable for the thin film to fabricate mirrors in the EUVL camera. We demonstrate an aspherical mirror fabrication using mask deposition technique. The result shows good agreement between the measured and desired thickness profiles.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Masahito Niibe, Atsushi Miyafuji, Hiroo Kinoshita, Takeo Watanabe, Shozo Inoue, and Keiji Koterazawa "Fabrication of an aspherical mirror for extreme-ultraviolet lithography (EUVL) optics", Proc. SPIE 3447, Advances in Mirror Technology for Synchrotron X-Ray and Laser Applications, (13 November 1998); https://doi.org/10.1117/12.331127
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Multilayers

Mirrors

Extreme ultraviolet lithography

Surface roughness

Argon

Aspheric lenses

Cameras

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