Metrology of a mirror at the Advanced Photon Source: comparison between optical and x-ray measurements

Lahsen Assoufid; Jonathan C. Lang; Jin Wang; George Srajer

doi:10.1117/12.331123

13 November 1998 Metrology of a mirror at the Advanced Photon Source: comparison between optical and x-ray measurements

Lahsen Assoufid, Jonathan C. Lang, Jin Wang, George Srajer

Proceedings Volume 3447, Advances in Mirror Technology for Synchrotron X-Ray and Laser Applications; (1998) https://doi.org/10.1117/12.331123
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

This paper describes metrology of a vertically focusing mirror on the bending magnet beamline in sector-1 of the Advanced Photon Source, Argonne National Laboratory. The mirror was evaluated using measurements from both an optical long trace profiler and x-rays. Slope error profiles obtained with the two methods were compared and were found to be in a good agreement. Further comparisons were made between x-ray measurements and results from the SHADOW ray-tracing code.

Citation Download Citation

Lahsen Assoufid, Jonathan C. Lang, Jin Wang, and George Srajer "Metrology of a mirror at the Advanced Photon Source: comparison between optical and x-ray measurements", Proc. SPIE 3447, Advances in Mirror Technology for Synchrotron X-Ray and Laser Applications, (13 November 1998); https://doi.org/10.1117/12.331123

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