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11 December 1998 Doubly focusing crystal analyzer for x-ray fluorescence holography
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Our goal was to prepare an X-ray Fluorescence Holography (XFH) experiment at ESRF, in which the holographic information is approximately 0.3% of the overall isotropic fluorescent radiation. This requires a very pure fluorescent signal and the highest possible count rate. Therefore, we designed a focusing analyzer system with large solid angle acceptance. It consists of a sagittally bent pyrolithic graphite crystals with large solid angle acceptance used in the parafocusing mode for the meridional plane. We successfully applied it to collect a large fraction of isotropically emitted Fe, Ni and Pd K(alpha ) fluorescent photons with the [002] and [006] graphite reflections, respectively. After characterizing the phase space efficiency (angular acceptance, focal spot shape) of a 200 mm long, doubly focusing analyzer, we developed a full circular one (220 mm diameter) to increase the solid angle acceptance to approximately 2 10-2 sr, in view of an XFH experiment on MBE grown thin films. This analyzer can be used more generally at K and L edges for atoms with Z greater than or equal to 20.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stefano Marchesini, Michel Belakhovsky, and Andreas K. Freund "Doubly focusing crystal analyzer for x-ray fluorescence holography", Proc. SPIE 3448, Crystal and Multilayer Optics, (11 December 1998);

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