Influence of the characteristics of ESRF x-ray beams on diffraction in  a perfect crystal

V. Mocella; Jean-Pierre Guigay; Yves P. Epelboin; Andreas K. Freund

doi:10.1117/12.332497

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11 December 1998 Influence of the characteristics of ESRF x-ray beams on diffraction in a perfect crystal

V. Mocella, Jean-Pierre Guigay, Yves P. Epelboin, Andreas K. Freund

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Proceedings Volume 3448, Crystal and Multilayer Optics; (1998) https://doi.org/10.1117/12.332497
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

On a beam line of a third generation synchrotron facility, such as the ESRF, the small source size of the source and the large distance from the source to the sample are responsible for the remarkable coherence properties of the beam at the sample position. In Bragg diffraction by a perfect crystal, the incident beam is to be considered as a coherent spherical wave, with angular aperture larger than the angular reflection range of the crystal. We show theoretically that, in such condition, the intensity profile of a Bragg diffraction topograph, in transmission geometry (Laue case), should reproduce the angular Bragg reflection profile (rocking curve) of the crystal. We discuss the conditions to be fulfilled concerning the wavelength dispersion of the incident beam. An experimental verification of the theoretical prediction is presented.

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V. Mocella, Jean-Pierre Guigay, Yves P. Epelboin, and Andreas K. Freund "Influence of the characteristics of ESRF x-ray beams on diffraction in a perfect crystal", Proc. SPIE 3448, Crystal and Multilayer Optics, (11 December 1998); https://doi.org/10.1117/12.332497

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