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6 November 1998 Bend magnet beamline for scanning transmission x-ray microscopy at the Advanced Light Source
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Abstract
A bend magnet at the advanced light source is sufficiently bright to illuminate a scanning transmission x-ray microscope, with a zone plate lens to focus the soft x-ray beam at the diffraction limit. The beam line must be carefully optimized for this one purpose of high count-rates, of the order of 1MHz, are to be achieved in the microscope. Such a design is described. The nominal resolving power is 2000 from 150eV to 600eV using a single spherical diffraction grating. Twice the resolving power is available at reduced flux, and the intensity can be traded independently against the spatial and spectral resolution.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Anthony Warwick, Howard A. Padmore, and Harald Ade "Bend magnet beamline for scanning transmission x-ray microscopy at the Advanced Light Source", Proc. SPIE 3449, X-Ray Microfocusing: Applications and Techniques, (6 November 1998); https://doi.org/10.1117/12.330337
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