Paper
6 November 1998 Using x-ray microprobes for environmental research
Ken M. Kemner, Wenbing Yun, Zhonghou Cai, Barry P. Lai, Heung-Rae Lee, Dan G. Legnini, W. Rodrigues, Julie D. Jastrow, R. M. Miller, Stephan T. Pratt, M. A. Schneegurt, C. F. Kulpa Jr., Alvin J. M. Smucker
Author Affiliations +
Abstract
Understanding the fate of environmental contaminants is of fundamental importance in the development and evaluation of effective remediation strategies. Among the factors influencing the transport of these contaminants are the chemical speciation of the sample and the chemical and physical attributes of the surrounding medium. Characterization of the spatial distribution and chemical speciation at micron and submicron resolution is essential for studying the microscopic physical, geological, chemical, and biological interfaces that play a crucial role in determining contaminant fate and mobility. Hard x-ray spectroscopy and imaging are powerful techniques for the element-specific investigation of complex environmental samples at the needed micron and submicron resolution. An important advantage of these techniques result from the large penetration depth of hard x-rays in water. This minimizes the requirements for sample preparation and allows the detailed study of hydrated samples. This paper discuses some current problems in environmental science that can be addressed by using synchrotron- based x-ray imaging and spectroscopy. These concepts are illustrated by the results of recent x-ray microscopy studies at the Advanced Photon Source.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ken M. Kemner, Wenbing Yun, Zhonghou Cai, Barry P. Lai, Heung-Rae Lee, Dan G. Legnini, W. Rodrigues, Julie D. Jastrow, R. M. Miller, Stephan T. Pratt, M. A. Schneegurt, C. F. Kulpa Jr., and Alvin J. M. Smucker "Using x-ray microprobes for environmental research", Proc. SPIE 3449, X-Ray Microfocusing: Applications and Techniques, (6 November 1998); https://doi.org/10.1117/12.330354
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Cited by 3 scholarly publications.
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KEYWORDS
Metals

X-rays

Interfaces

Soil contamination

Soil science

Fungi

Hard x-rays

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