New transmission-cavity technique for surface impedance measurements in the submillimeter-wave region

W. Mayr; Alfred Philipp; G. Kallinger

doi:10.1117/12.331174

13 November 1998 New transmission-cavity technique for surface impedance measurements in the submillimeter-wave region

W. Mayr, Alfred Philipp, G. Kallinger

Proceedings Volume 3465, Millimeter and Submillimeter Waves IV; (1998) https://doi.org/10.1117/12.331174
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

The measurement of the surface impedance of a sample at microwave frequencies is usually done by placing the sample inside a microwave cavity. The resulting change of the quality factor and of the resonance frequency of the cavity can be used to determine the complex surface impedance of the sample. Instead of measuring the whole lorentzian curve a fast method using automatic frequency control (AFC) can be used where only the transmitted signal amplitude and the resonance frequency are measured. This method is very useful whenever the surface impedance depends strongly on temperature as for example in the case of a superconducting transition and when the temperature stabilization of the small cavity is a severe problem. However this method can only be used with a microwave source which exhibits nearly no dependence of the output power on the frequency and which has a very good frequency stabilization. Such sources are available only for frequencies up to 60 GHz. Problems with backward wave oscillators (BWO) at higher frequencies can be avoided by using a new computer controlled frequency (CCF) method. This method offers the advantage of a full control over the output frequency of the source and the ability to measure very fast and with high accuracy all the parameters necessary for the determination of the surface impedance.

Citation Download Citation

W. Mayr, Alfred Philipp, and G. Kallinger "New transmission-cavity technique for surface impedance measurements in the submillimeter-wave region", Proc. SPIE 3465, Millimeter and Submillimeter Waves IV, (13 November 1998); https://doi.org/10.1117/12.331174

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