Hybrid optoelectronic processing and computer vision techniques for intelligent debris analysis

Adriana Dumitras; Faouzi Kossentini; Ali Jerbi; Q. M. Jonathan Wu; Chander Prakash Grover

doi:10.1117/12.326773

9 October 1998 Hybrid optoelectronic processing and computer vision techniques for intelligent debris analysis

Adriana Dumitras, Faouzi Kossentini, Ali Jerbi, Q. M. Jonathan Wu, Chander Prakash Grover

Proceedings Volume 3466, Algorithms, Devices, and Systems for Optical Information Processing II; (1998) https://doi.org/10.1117/12.326773
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

Intelligent Debris Analysis (IDA) requires significant time and resources due to the large number of images to be processed. To address this problem, we propose a hybrid optoelectronic and computer vision approach. Two major steps are involved for IDA: patch-level analysis and particle level analysis. An optoelectronic detection system using two ferroelectric liquid crystal spatial light modulators is designed and constructed to perform path-level analysis, and advanced computer vision techniques are developed to carry out more intelligent particle-level analysis. Since typically only a small portion of the debris filters require more sophisticated particle-level analysis, the proposed approach enables high-speed automated analysis of debris filters due to the inherent parallelism provided by the optoelectronic system.

Citation Download Citation

Adriana Dumitras, Faouzi Kossentini, Ali Jerbi, Q. M. Jonathan Wu, and Chander Prakash Grover "Hybrid optoelectronic processing and computer vision techniques for intelligent debris analysis", Proc. SPIE 3466, Algorithms, Devices, and Systems for Optical Information Processing II, (9 October 1998); https://doi.org/10.1117/12.326773

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KEYWORDS

Particles

Computer vision technology

Machine vision

Optoelectronics

Image segmentation

Optical filters

Spatial light modulators

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