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13 October 1998 Superresolution structure for optical data storage by near-field optics
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Abstract
A new proposal for near-field data storage and the basic experiment under a high speed disk rotation are described. Using the thermally nonlinear property of an Antimony thin film and an intermediate layer of SiN with a thickness of 20 nm, less than 100 nm sized marks were recorded and retrieved in an optical phase change film beyond the diffraction limit, with a wavelength of 680nm and a lens NA of 0.6.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Junji Tominaga, Takashi Nakano, and Nobufumi Atoda "Superresolution structure for optical data storage by near-field optics", Proc. SPIE 3467, Far- and Near-Field Optics: Physics and Information Processing, (13 October 1998); https://doi.org/10.1117/12.326835
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