Shift-invariant limited photorefractive-based correlators

Francis T. S. Yu; Shizhuo Yin; Chun-Te Li

doi:10.1117/12.326866

9 October 1998 Shift-invariant limited photorefractive-based correlators

Francis T. S. Yu, Shizhuo Yin, Chun-Te Li

Proceedings Volume 3470, Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications IV; (1998) https://doi.org/10.1117/12.326866
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

Although photorefractive (PR) filter has the advantage of large storage capacity, the thickness of the filter also impairs the target shift limitation. In this paper, we have investigated the thickness requirement, as imposed by the focal depth of the transform lens, and the shift-invariant, as imposed by the Bragg diffraction. The commonly used photorefractive-based correlators are studied, which are VanderLugt, joint transform, and reflective types (RC) correlators. We have shown that PR-RC performance better, in terms of shift-invariant tolerance.

Citation Download Citation

Francis T. S. Yu, Shizhuo Yin, and Chun-Te Li "Shift-invariant limited photorefractive-based correlators", Proc. SPIE 3470, Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications IV, (9 October 1998); https://doi.org/10.1117/12.326866

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