Charge trapping in molecularly doped polymers

Liang-Bih Lin; Paul M. Borsenberger; Edward H. Magin; Susan A. Visser; William T. Gruenbaum

doi:10.1117/12.328157

23 October 1998 Charge trapping in molecularly doped polymers

Liang-Bih Lin, Paul M. Borsenberger, Edward H. Magin, Susan A. Visser, William T. Gruenbaum

Proceedings Volume 3471, Xerographic Photoreceptors and Organic Photorefractive Materials IV; (1998) https://doi.org/10.1117/12.328157
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

Hole trapping has been investigated in a series of donor doped polymers containing different concentrations of traps with different depths. The mobilities decrease with increasing trap concentration and trap depth while the general features of the field and temperature dependencies remain unchanged. The results are discussed within the framework of the recent simulations of Wolf et al. and Borsenberger et al. and an early model due to Hoesterey and Letson. The results are in agreement with the simulations of Wolf et al. and Borsenberger et al. and confirm the argument that for shallow trapping the basic phenomenology of transport, as revealed by the field and temperature dependencies of the mobility, remain unchanged. Quantitatively, the effects of traps can be accounted for by the replacement of the energy width of the hopping site manifold (sigma) by an effective width (sigma) _eff. However, the use of the Hoesterey-Letson formalism leads to some discrepancies with respect to different trap depths.

Citation Download Citation

Liang-Bih Lin, Paul M. Borsenberger, Edward H. Magin, Susan A. Visser, and William T. Gruenbaum "Charge trapping in molecularly doped polymers", Proc. SPIE 3471, Xerographic Photoreceptors and Organic Photorefractive Materials IV, (23 October 1998); https://doi.org/10.1117/12.328157

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