Paper
22 December 1998 Anisotropic enhancement of flux pinning in Y-Ba-Cu-O thin films grown by the step-flow growth mode
Hanns-Ulrich Habermeier, T. Haage, Jorg Zegenhagen, V. G. Hadjev, R. Warthmann, Ch. Joob
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Abstract
YBa2Cu3O7-x (YBCO) thin films have been grown on vicinal cut SrTiO3 (001) single crystals. The films show a pronounced anisotropic resistivity and flux pinning properties in the substrate plane. UHV scanning tunneling microscopy and transmission electron microscopy have been used to investigate the substrate surface, film morphology and the growth induced defect structure. The anisotropy is caused by planar defects generated via self-organization of the YBCO which lead to an exceptionally large critical current density up to 8 X 1011 A/m2 at 4.2 K. The films are partially detwinned as a consequence of the modification of the growth mode by the terrace-type surface morphology due to the vicinal cut of the substrates.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hanns-Ulrich Habermeier, T. Haage, Jorg Zegenhagen, V. G. Hadjev, R. Warthmann, and Ch. Joob "Anisotropic enhancement of flux pinning in Y-Ba-Cu-O thin films grown by the step-flow growth mode", Proc. SPIE 3481, Superconducting and Related Oxides: Physics and Nanoengineering III, (22 December 1998); https://doi.org/10.1117/12.335877
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Cited by 3 scholarly publications.
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KEYWORDS
Thin films

Crystals

Anisotropy

Scanning tunneling microscopy

Transmission electron microscopy

Raman spectroscopy

Superconductors

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