Efficient numerical method for characterizing diffraction gratings

Rene Somas; Laurent Bigue; Pierre Ambs

doi:10.1117/12.308855

22 May 1998 Efficient numerical method for characterizing diffraction gratings

Rene Somas, Laurent Bigue, Pierre Ambs

Proceedings Volume 3490, Optics in Computing '98; (1998) https://doi.org/10.1117/12.308855
Event: Optics in Computing '98, 1998, Bruges, Belgium

Abstract

The complete knowledge of geometrical parameters of a periodically modulated material is of great scientific interest, because it allows the user to determine the diffracted image. The modulation profile or the thickness of a phase holographic grating are two of these parameters. They can be determined a posteriori by the measurement of the intensities distribution over different orders, with a comparison of the theoretical and measured angular or spectral selectivities. This method involves a large number of measurements. We propose a new approach, which most of the time needs only one measurement of intensity and polarization (for each of the diffracted orders). The great advantage of the method is the processing of tedious tasks by computers.

Citation Download Citation

Rene Somas, Laurent Bigue, and Pierre Ambs "Efficient numerical method for characterizing diffraction gratings", Proc. SPIE 3490, Optics in Computing '98, (22 May 1998); https://doi.org/10.1117/12.308855

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