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4 December 1998 Multiwavelength characterization of a traveling-wave photodetector including electrode effects
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Abstract
A novel Schottky-contact traveling-wave photodetector has been rigorously characterized at two optical wavelengths using the Method of Lines. This method is an accurate numerical technique used to model the electromagnetic performance of optical and microwave devices. Attention has been paid to the proper modeling of the nearby overlying electrode in order to determine its influence on the optical performance of the photodetector. It has been found that the electrode has an important impact, reducing power confinement in the active region of the device and increasing its polarization sensitivity. The wavelength dependency of these effects has been determined for the first time in such a device. The results illustrate the importance of rigorous modeling as an essential step in the design of high-speed optoelectronic components.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pierre Berini "Multiwavelength characterization of a traveling-wave photodetector including electrode effects", Proc. SPIE 3491, 1998 International Conference on Applications of Photonic Technology III: Closing the Gap between Theory, Development, and Applications, (4 December 1998); https://doi.org/10.1117/12.328642
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