Multiple layer reflectance and spectroscopic calibration for remote sensing spectral imagers

William F. Seng; Bruce Rafert; Leonard John Otten III; Andrew D. Meigs

doi:10.1117/12.328671

4 December 1998 Multiple-layer reflectance and spectroscopic calibration for remote sensing spectral images

William F. Seng, Bruce Rafert, Leonard John Otten III, Andrew D. Meigs

Proceedings Volume 3491, 1998 International Conference on Applications of Photonic Technology III: Closing the Gap between Theory, Development, and Applications; (1998) https://doi.org/10.1117/12.328671
Event: 1998 International Conference on Applications of Photonic Technology, 1998, Ottawa, Canada

Abstract

UV-VIS-NIR ratiometric reflectance data was obtained for several commonly utilized remote sensing calibration standards used in Fourier Transform Hyperspectral Imaging. We found that single layer reflectance depends on the degree of translucency and hence on the particular choice of background material, from which multiple layer reflectance and extracted absorption and scattering curves logically follow. These data are given as a function of incident wavelength for each calibration standard. Because optical properties are determined by the combination of scattering and absorption, we deconvolved their effects on each material's spectrum.

Citation Download Citation

William F. Seng, Bruce Rafert, Leonard John Otten III, and Andrew D. Meigs "Multiple-layer reflectance and spectroscopic calibration for remote sensing spectral images", Proc. SPIE 3491, 1998 International Conference on Applications of Photonic Technology III: Closing the Gap between Theory, Development, and Applications, (4 December 1998); https://doi.org/10.1117/12.328671

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