Dynamic high-g loading of MEMS sensors: ground and flight testing

T. Gordon Brown; Bradford S. Davis

doi:10.1117/12.324064

1 September 1998 Dynamic high-g loading of MEMS sensors: ground and flight testing

T. Gordon Brown, Bradford S. Davis

Proceedings Volume 3512, Materials and Device Characterization in Micromachining; (1998) https://doi.org/10.1117/12.324064
Event: Micromachining and Microfabrication, 1998, Santa Clara, CA, United States

Abstract

Low-cost, micromachined inertial measurement sensors have been steadily emerging into the commercial marketplace. Some of these sensors were evaluated through ground and flight tests for their insertion potential into military applications. High-g shock test results suggest that some of these sensors are rugged enough for both low-g and high-g launch survivability. A description of dynamic loading on the sensors and techniques used to mitigate failures is presented. Artillery projectiles and rockets, instrumented with 'automobile grade: microelectromechanical (MEMS) accelerometers and telemetry units, have recently been flight tested with good success. Analyses of the accelerometer data show good comparison to radar-based acceleration measurements and 6-degree-of-freedom trajectory simulations. This paper presents the flight and ground test results and describe the challenges for using these strapdown devices on rolling projectiles.

Citation Download Citation

T. Gordon Brown and Bradford S. Davis "Dynamic high-g loading of MEMS sensors: ground and flight testing", Proc. SPIE 3512, Materials and Device Characterization in Micromachining, (1 September 1998); https://doi.org/10.1117/12.324064

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