Paper
8 September 1998 Characterization techniques for surface-micromachined devices
William P. Eaton, Norman F. Smith, Lloyd W. Irwin, Danelle M. Tanner
Author Affiliations +
Proceedings Volume 3514, Micromachined Devices and Components IV; (1998) https://doi.org/10.1117/12.323919
Event: Micromachining and Microfabrication, 1998, Santa Clara, CA, United States
Abstract
Using a microengine as the primary test vehicle, we have examined several aspects of characterization. Parametric measurements provide fabrication process information. Drive signal optimization is necessary for increased microengine performance. Finally, electrical characterization of resonant frequency and quality factor can be more accurate than visual techniques.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
William P. Eaton, Norman F. Smith, Lloyd W. Irwin, and Danelle M. Tanner "Characterization techniques for surface-micromachined devices", Proc. SPIE 3514, Micromachined Devices and Components IV, (8 September 1998); https://doi.org/10.1117/12.323919
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Cited by 12 scholarly publications.
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KEYWORDS
Amplifiers

Optical inspection

Resistance

Visualization

Bandpass filters

Inspection

Modulation

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