Paper
22 June 1999 Detector of ionizing beam parameters based on an open ICT: visualization and processing
A. N. Artemiev, L. I. Ioudin, S. T. Latushkin, V. G. Mikhailov, V. A. Rezvov
Author Affiliations +
Proceedings Volume 3516, 23rd International Congress on High-Speed Photography and Photonics; (1999) https://doi.org/10.1117/12.350481
Event: Twenty-Third International Congress on High-Speed Photography and Photonics, 1998, Moscow, Russian Federation
Abstract
We proposed and developed a detector for on line non- destructive monitoring of geometrical parameters of ionizing beams. The detector gives the size of a beam cross-section, cross-section density distribution, position of the cross- section gravity center and its displacement. The detector contains electrostatic extractor and analyzer as well as open Image Converter Tube (ICT) ICT is made of two Micro Channel Plates (MCP) with luminescence screen. Detector is placed within beam line at residual gas pressure 10-4 - 10-6 Torr. The residual gas works as a target. Electron optic analyzes ions on energy, which they get in extractor electric field. The ion picture of the beam under investigation is put on input MCP. The screen of the ICT forms image of the beam. TV camera registers this image. Then the image is processed in a computer. Computer processing gives one the possibility to have numeric beam parameters. Statistical processing makes the sensitivity better and estimates displacement of the beam with the accuracy of order of a few microns. The detector was investigated on different particles accelerators and on synchrotron radiation sources. Modified detector gave a possibility to measure microstructure of cyclotron beam. The detectors can be used on scientific and industrial accelerators.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. N. Artemiev, L. I. Ioudin, S. T. Latushkin, V. G. Mikhailov, and V. A. Rezvov "Detector of ionizing beam parameters based on an open ICT: visualization and processing", Proc. SPIE 3516, 23rd International Congress on High-Speed Photography and Photonics, (22 June 1999); https://doi.org/10.1117/12.350481
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KEYWORDS
Sensors

Printed circuit board testing

Image processing

Ions

Particles

Microchannel plates

Synchrotron radiation

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