Model-based inspection of multipackage food products using a twin-beam x-ray system

Stephen C. Palmer; Bruce G. Batchelor

doi:10.1117/12.326947

6 October 1998 Model-based inspection of multipackage food products using a twin-beam x-ray system

Stephen C. Palmer, Bruce G. Batchelor

Proceedings Volume 3521, Machine Vision Systems for Inspection and Metrology VII; (1998) https://doi.org/10.1117/12.326947
Event: Photonics East (ISAM, VVDC, IEMB), 1998, Boston, MA, United States

Abstract

A twin-orthogonal-fanbeam x-ray system has been built as part of a six-partner project funded by the Commission of the European Union. The images created by this system represent plan and side views of the object to be inspected. Using such a system, it is possible to locate a point-like feature that creates a significant shadow in both beams, in a 3D space. However, the real value of such a system lies in the fact that it is often possible to see a foreign body, such as a small piece of loose glass, within a jar using one beam, when the same contaminant is invisible to the other beam. Such a situation typically arises when the foreign body is obscured by the x-ray shadow of the neck-shoulder region of a jar. The x-ray system built by our colleagues in this consortium is being used to examine, simultaneously, six jars of semi-fluid savory sauce, held together by shrink-wrapping on a cardboard tray. The inspection algorithm consists of fitting multi-part models of the image intensity function to both the plan and side-view images. Once a model has been fitted, it is possible to use image comparison, in order to highlight any foreign bodies. The pre-processed plan and side-view images are analyzed and correlated together, so that in many cases, a foreign body whose view is obscured in one image can be detected in the other.

Citation Download Citation

Stephen C. Palmer and Bruce G. Batchelor "Model-based inspection of multipackage food products using a twin-beam x-ray system", Proc. SPIE 3521, Machine Vision Systems for Inspection and Metrology VII, (6 October 1998); https://doi.org/10.1117/12.326947

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