Paper
18 December 1998 New approach to optical proximity correction
Anja Rosenbusch, Andrew C. Hourd, Casper A. H. Juffermans, Hartmut Kirsch, Frederic P. Lalanne, Wilhelm Maurer, Carmelo Romeo, Kurt G. Ronse, Patrick Schiavone, Michal Simecek, Olivier Toublan, John G. Watson, Wolfram Ziegler, Rainer Zimmermann
Author Affiliations +
Abstract
A hierarchical rule based optical proximity effect correction approach is presented. The approach has been driven by maskmaking and production requirements to make OPC a practical problem solution. The model based rule generation is presented, as well as benchmark tests on different state-of- the-art test chips.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Anja Rosenbusch, Andrew C. Hourd, Casper A. H. Juffermans, Hartmut Kirsch, Frederic P. Lalanne, Wilhelm Maurer, Carmelo Romeo, Kurt G. Ronse, Patrick Schiavone, Michal Simecek, Olivier Toublan, John G. Watson, Wolfram Ziegler, and Rainer Zimmermann "New approach to optical proximity correction", Proc. SPIE 3546, 18th Annual BACUS Symposium on Photomask Technology and Management, (18 December 1998); https://doi.org/10.1117/12.332856
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Cited by 1 scholarly publication.
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KEYWORDS
Optical proximity correction

Photomasks

Reticles

Inspection

Data modeling

Deep ultraviolet

Manufacturing

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