Active trigonometry and its application to thickness measurement on reflective surface

Hong Miao; Xiaoping Wu

doi:10.1117/12.318375

10 August 1998 Active trigonometry and its application to thickness measurement on reflective surface

Hong Miao, Xiaoping Wu

Proceedings Volume 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II; (1998) https://doi.org/10.1117/12.318375
Event: Photonics China '98, 1998, Beijing, China

Abstract

The paper introduces a novel method to measure accurate thickness. On the basis of the principle of active trigonometry with vertically incident mode, an obliquely incident mode is proposed. The method is specially designed for a reflective surface of an object, such as a thin steel plate, to measure its thickness in real-time. The influence of the small deflection which is caused by mechanical vibrations is discussed and the manner to reduce this influence is given too.

Citation Download Citation

Hong Miao and Xiaoping Wu "Active trigonometry and its application to thickness measurement on reflective surface", Proc. SPIE 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II, (10 August 1998); https://doi.org/10.1117/12.318375

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