Effective approach for detecting bands of EBSP with Hough transform

Linsen Chen; David P. Casasent

doi:10.1117/12.318344

10 August 1998 Effective approach for detecting bands of EBSP with Hough transform

Linsen Chen, David P. Casasent

Proceedings Volume 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II; (1998) https://doi.org/10.1117/12.318344
Event: Photonics China '98, 1998, Beijing, China

Abstract

An effective approach for the detection of the electron backscatter diffraction patterns with the Hough transform has been described in this paper. Based on the peak-finding method and the enhancement filter in the Hough space, this approach can give automatically the orientations, widths and coordinates of the central intersection points of the bands in the patterns. Comparison with other Hough approaches shows that our approach is more robust for the very low quality patterns and has an advantage of low time cost. No further fitting scheme or constrain conditions are needed to get correct bands. Results have been presented.

Citation Download Citation

Linsen Chen and David P. Casasent "Effective approach for detecting bands of EBSP with Hough transform", Proc. SPIE 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II, (10 August 1998); https://doi.org/10.1117/12.318344

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